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  • (-) Organizational Unit = 405 Transport at Nanoscale Interfaces
  • (-) Publication Year = 2006 - 2019
  • (-) Keywords ≠ reference material
  • (-) Empa Authors = Nellen, Philipp M.
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Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage?
Sezen, M., Plank, H., Nellen, P. M., Meier, S., Chernev, B., Grogger, W., … Poelt, P. (2009). Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage? Physical Chemistry Chemical Physics, 11(25), 5130-5133. https://doi.org/10.1039/b816893h
Engineering gold nanoantennae to enhance the emission of quantum emitters
Agio, M., Mori, G., Kaminski, F., Rogobete, L., Kühn, S., Callegari, V., … Sandoghdar, V. (2007). Engineering gold nanoantennae to enhance the emission of quantum emitters. In L. Dong, Y. Katagiri, E. Higurashi, H. T. Toshiyoshi, & Y. A. Peter (Eds.), Proceedings of SPIE: Vol. 6717. Optomechatronic micro/nano devices and components III (p. 67170R (9 pp.). https://doi.org/10.1117/12.754367
Fabrication and modification of photonic structures with focused ion beam
Callegari, V., Nellen, P. M., Brönnimann, R., Nanzer, T., & Sennhauser, U. (2007). Fabrication and modification of photonic structures with focused ion beam. Praktische Metallographie, 44(5), 239-243. https://doi.org/10.3139/147.100341
Focused ion beam iodine-enhanced etching of high aspect ratio holes in InP photonic crystals
Callegari, V., Nellen, P. M., Kaufmann, J., Strasser, P., Robin, F., & Sennhauser, U. (2007). Focused ion beam iodine-enhanced etching of high aspect ratio holes in InP photonic crystals. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 25(6), 2175-2179. https://doi.org/10.1116/1.2804607
Spontaneous growth of uniformly distributed in nanodots and InI<SUB>3</SUB> nanowires on InP induced by a focused ion beam
Callegari, V., & Nellen, P. M. (2007). Spontaneous growth of uniformly distributed in nanodots and InI3 nanowires on InP induced by a focused ion beam. Physica Status Solidi A: Applications and Materials, 204(6), 1665-1671. https://doi.org/10.1002/pssa.200675337
Surface chemistry and optimization of focused ion beam iodine-enhanced etching of indium phosphide
Callegari, V., Nellen, P. M., Yang, T., Hauert, R., Müller, U., Hernández-Ramírez, F., & Sennhauser, U. (2007). Surface chemistry and optimization of focused ion beam iodine-enhanced etching of indium phosphide. Applied Surface Science, 253(22), 8969-8973. https://doi.org/10.1016/j.apsusc.2007.05.026
FIB precise prototyping and simulation
Nellen, P. M., Callegari, V., Hofmann, J., Platzgummer, E., & Klein, C. (2007). FIB precise prototyping and simulation. In R. Kalyanaraman, U. Valbusa, & Z. Zhang (Eds.), Materials research society symposium proceedings: Vol. 960. Symposium N – self assembly of nanostructures aided by ion- or photon-beam irradiation – fundamentals and applications (pp. 0960-N10-03-LL06-03 (13 pp.). https://doi.org/10.1557/PROC-0960-N10-03-LL06-03
Focused ion beam modifications of indium phosphide photonic crystals
Nellen, P. M., Strasser, P., Callegari, V., Wüest, R., Erni, D., & Robin, F. (2007). Focused ion beam modifications of indium phosphide photonic crystals. Microelectronic Engineering, 84(5-8), 1244-1247. https://doi.org/10.1016/j.mee.2007.01.037
Focused ion beam induced synthesis of a porous antimony nanowire network
Schoendorfer, C., Lugstein, A., Hyun, Y. J., Bertagnolli, E., Bischoff, L., Nellen, P. M., … Pongratz, P. (2007). Focused ion beam induced synthesis of a porous antimony nanowire network. Journal of Applied Physics, 102(4), 044308 (5 pp.). https://doi.org/10.1063/1.2771044
Reliability, standardization, and validation of optical fiber sensors
Brönnimann, R., Held, M., & Nellen, P. M. (2006). Reliability, standardization, and validation of optical fiber sensors (p. 4 pp.). Presented at the 18th International Conference on Optical Fiber Sensors. Cancún, México.
Fabrication and electrical characterization of circuits based on individual tin oxide nanowires
Hernández-Ramírez, F., Tarancón, A., Casals, O., Rodríguez, J., Romano-Rodríguez, A., Morante, J. R., … Nellen, P. M. (2006). Fabrication and electrical characterization of circuits based on individual tin oxide nanowires. Nanotechnology, 17(22), 5577-5583. https://doi.org/10.1088/0957-4484/17/22/009
FIB-milling of photonic structures and sputtering simulation
Nellen, P. M., Callegari, V., & Brönnimann, R. (2006). FIB-milling of photonic structures and sputtering simulation. Microelectronic Engineering, 83(4-9), 1805-1808. https://doi.org/10.1016/j.mee.2006.01.176
Focused ion beam modifications on indium phosphide photonic crystals
Nellen, P. M., Callegari, V., Strasser, P., Rauscher, K., Wüest, R., Erni, D., & Robin, F. (2006). Focused ion beam modifications on indium phosphide photonic crystals (p. 2 pp.). Presented at the 32nd International Conference on Micro- and Nano-Engineering 2006. Barcelona, Spain.
Milling micro-structures using focused ion beams and its application to photonic components
Nellen, P. M., & Brönnimann, R. (2006). Milling micro-structures using focused ion beams and its application to photonic components. Measurement Science and Technology, 17(5), 943-948. https://doi.org/10.1088/0957-0233/17/5/S01
Preparative methods for nanoanalysis of materials with focused ion beam instruments
Nellen, P. M., Callegari, V., & Sennhauser, U. (2006). Preparative methods for nanoanalysis of materials with focused ion beam instruments. Chimia, 60(11), 735-741. https://doi.org/10.2533/chimia.2006.735