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  • (-) Empa Laboratories = 405 Transport at Nanoscale Interfaces
  • (-) Publication Year = 2006 - 2019
  • (-) Empa Authors = Schütz, Philipp
  • (-) Journal ≠ NDT and E International
  • (-) Keywords = computed tomography
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Quantitative Untersuchung der Streubeiträge in Hochenergie-Röntgencomputertomografie
Stritt, C., Schuetz, P., Plamondon, M., Flisch, A., Hofmann, J., & Sennhauser, U. (2016). Quantitative Untersuchung der Streubeiträge in Hochenergie-Röntgencomputertomografie. Materials Testing, 58(2), 122-126. https://doi.org/10.3139/120.110824
Quantitative assessment of scattering contributions in MeV-industrial X-ray computed tomography
Stritt, C., Schuetz, P., Hofmann, J., Flisch, A., & Sennhauser, U. (2014). Quantitative assessment of scattering contributions in MeV-industrial X-ray computed tomography (p. (9 pp.). Presented at the 11th European conference on non-destructive testing (ECNDT 2014).