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  • (-) Empa Laboratories = 405 Transport at Nanoscale Interfaces
  • (-) Publication Year = 2006 - 2019
  • (-) Keywords = computed tomography
  • (-) Keywords ≠ hybrid simulation
  • (-) Publication Status ≠ Published
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Quantitative assessment of scattering contributions in MeV-industrial X-ray computed tomography
Stritt, C., Schuetz, P., Hofmann, J., Flisch, A., & Sennhauser, U. (2014). Quantitative assessment of scattering contributions in MeV-industrial X-ray computed tomography (p. (9 pp.). Presented at the 11th European conference on non-destructive testing (ECNDT 2014).
Phase contrast cone beam tomography with an X-ray grating interferometer
Jerjen, I., Revol, V., Kottler, C., Lüthi, T., Sennhauser, U., Kaufmann, R., & Urban, C. (2010). Phase contrast cone beam tomography with an X-ray grating interferometer. In P. K. Rastogi & E. Hack (Eds.), AIP conference proceedings: Vol. 1236. International conference on advanced phase measurement methods in optics and imaging (pp. 227-231). https://doi.org/10.1063/1.3426118
Schnelle und genaue Abschätzung des Streusignals in Cone-Beam Computertomografie
Thierry, R., Hofmann, J., Miceli, A., Flisch, A., & Simon, M. (2008). Schnelle und genaue Abschätzung des Streusignals in Cone-Beam Computertomografie. In Proceedings Industrielle Computertomografie Tagung (p. (6 pp.). Shaker Verlag.
Fast estimation of single scattering projections: a simulation case in cone-beam CT
Thierry, R., Miceli, A., Hofmann, J., & Flisch, A. (2007). Fast estimation of single scattering projections: a simulation case in cone-beam CT. In Proceedings: European NDT days in Prague 2007 (pp. 207-215). Brno University of Technology.