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Quantitative assessment of scattering contributions in MeV-industrial X-ray computed tomography
Stritt, C., Schuetz, P., Hofmann, J., Flisch, A., & Sennhauser, U. (2014). Quantitative assessment of scattering contributions in MeV-industrial X-ray computed tomography (p. (9 pp.). Presented at the 11th European conference on non-destructive testing (ECNDT 2014).