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  • (-) Empa Authors = Cancellieri, Claudia
  • (-) Keywords = thin films
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Strain depth profiles in thin films extracted from in-plane X-ray diffraction
Cancellieri, C., Ariosa, D., Druzhinin, A. V., Unutulmazsoy, Y., Neels, A., & Jeurgens, L. P. H. (2021). Strain depth profiles in thin films extracted from in-plane X-ray diffraction. Journal of Applied Crystallography, 54, 87-98. https://doi.org/10.1107/S1600576720014843
Direct-epitaxial growth of SrAl<sub>2</sub>O<sub>4</sub>: Eu,Dy thin films on Al<sub>2</sub>O<sub>3</sub> substrate by pulsed laser deposition
Ma, H., Gagnidze, T., Walfort, B., Rossell, M. D., Cancellieri, C., Shorubalko, I., & La Mattina, F. (2019). Direct-epitaxial growth of SrAl2O4: Eu,Dy thin films on Al2O3 substrate by pulsed laser deposition. Applied Surface Science, 491, 53-59. https://doi.org/10.1016/j.apsusc.2019.06.098
Nano-structured Cu/W brazing fillers for advanced joining applications
Moszner, F., Cancellieri, C., Becker, C., Chiodi, M., Janczak-Rusch, J., & Jeurgens, L. P. H. (2016). Nano-structured Cu/W brazing fillers for advanced joining applications. Journal of Materials Science and Engineering B, 6(9-10), 226-230. https://doi.org/10.17265/2161-6221/2016.9-10.003