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  • (-) Empa Laboratories = 405 Transport at Nanoscale Interfaces
  • (-) Empa Authors = Jefimovs, Konstantins
  • (-) Keywords = electron beam collimation
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Electron beam characterization of double gate field emitter arrays fabricated by a focused ion beam assisted process
Helfenstein, P., Jefimovs, K., Kirk, E., Escher, C., Fink, H. W., & Tsujino, S. (2012). Electron beam characterization of double gate field emitter arrays fabricated by a focused ion beam assisted process. In 25th international vacuum nanoelectronics conference (pp. P2-12 (2 pp.). https://doi.org/10.1109/IVNC.2012.6316945
Aperture size dependent collimation in double gate field emitter arrays
Helfenstein, P., Kirk, E., Jefimovs, K., Escher, C., Fink, H. W., & Tsujino, S. (2011). Aperture size dependent collimation in double gate field emitter arrays. In A. Klümper (Ed.), International conference on vacuum nanoelectronics (IVNC). Proceedings. 2011 24th international vacuum nanoelectronics conference (pp. 103-104).
P1-14: collimation properties of molded molybdenum field emitters
Helfenstein, P., Kirk, E., Jefimovs, K., Vogel, T., Escher, C., Fink, H. W., & Tsujino, S. (2010). P1-14: collimation properties of molded molybdenum field emitters. In 23rd international vacuum nanoelectronics conference. IVNC 2010 (pp. 56-57). https://doi.org/10.1109/IVNC.2010.5563185