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Preparation of TEM samples of metal-oxide interface by the focused ion beam technique
Abolhassani, S., & Gasser, P. (2006). Preparation of TEM samples of metal-oxide interface by the focused ion beam technique.
Journal of Microscopy
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223
(1), 73-82. https://doi.org/10.1111/j.1365-2818.2006.01599.x
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