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Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy
Kawai, S., Glatzel, T., Hug, H. J., & Meyer, E. (2010). Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy. Nanotechnology, 21(24), 245704 (9 pp.). https://doi.org/10.1088/0957-4484/21/24/245704