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	Strain depth profiles in thin films extracted from in-plane X-ray diffraction Cancellieri, C., Ariosa, D., Druzhinin, A. V., Unutulmazsoy, Y., Neels, A., & Jeurgens, L. P. H. (2021). Strain depth profiles in thin films extracted from in-plane X-ray diffraction. Journal of Applied Crystallography, 54, 87-98. https://doi.org/10.1107/S1600576720014843 Detailed Record Published Version
	Real- and <em>Q</em>-space travelling: multi-dimensional distribution maps of crystal-lattice strain (<em>∊</em><sub>044</sub>) and tilt of suspended monolithic silicon nanowire structures Dolabella, S., Frison, R., Chahine, G. A., Richter, C., Schulli, T. U., Tasdemir, Z., … Neels, A. (2020). Real- and Q-space travelling: multi-dimensional distribution maps of crystal-lattice strain (∊₀₄₄) and tilt of suspended monolithic silicon nanowire structures. Journal of Applied Crystallography, 53(1), 58-68. https://doi.org/10.1107/S1600576719015504 Detailed Record Published Version Supplemental Material
	Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals Meduňa, M., Isa, F., Jung, A., Marzegalli, A., Albani, M., Isella, G., … von Känel, H. (2018). Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. Journal of Applied Crystallography, 51(2), 368-385. https://doi.org/10.1107/S1600576718001450 Detailed Record Published Version
	A tool for automatic recognition of [110] tilt grain boundaries in zincblende-type crystals Kozak, R., Kurdzesau, F., Prieto, I., Skibitzki, O., Schroeder, T., Arroyo Rojas Dasilva, Y., … Rossell, M. D. (2017). A tool for automatic recognition of [110] tilt grain boundaries in zincblende-type crystals. Journal of Applied Crystallography, 50(5), 1299-1306. https://doi.org/10.1107/S1600576717010858 Detailed Record Published Version
	Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling Meduna, M., Falub, C. V., Isa, F., Marzegalli, A., Chrastina, D., Isella, G., … von Känel, H. (2016). Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling. Journal of Applied Crystallography, 49, 976-986. https://doi.org/10.1107/S1600576716006397 Detailed Record Published Version
	Considerations on the model-free shape retrieval of inorganic nanocrystals from small-angle scattering data Burian, M., Fritz-Popovski, G., He, M., Kovalenko, M. V., Paris, O., & Lechner, R. T. (2015). Considerations on the model-free shape retrieval of inorganic nanocrystals from small-angle scattering data. Journal of Applied Crystallography, 48, 857-868. https://doi.org/10.1107/S1600576715006846 Detailed Record Published Version
	Real space crystallography of a complex metallic alloy: high-angle annular dark-field scanning transmission electron microscopy of o-Al<SUB>4</SUB>(Cr,Fe) Gaspari, R., Erni, R., Arroyo, Y., Parlinska-Wojtan, M., Dshemuchadse, J., Pignedoli, C. A., … Beni, A. (2014). Real space crystallography of a complex metallic alloy: high-angle annular dark-field scanning transmission electron microscopy of o-Al₄(Cr,Fe). Journal of Applied Crystallography, 47(3), 1026-1031. https://doi.org/10.1107/S1600576714008656 Detailed Record Published Version
	<em>SOWOS</em>: An open-source program for the three-dimensional Wulff construction Scopece, D. (2013). SOWOS: An open-source program for the three-dimensional Wulff construction. Journal of Applied Crystallography, 46(3), 811-816. https://doi.org/10.1107/S0021889813005426 Detailed Record Published Version