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Thermal-induced interface degradation in perovskite light-emitting diodes
Zou, Y., Wu, T., Fu, F., Bai, S., Cai, L., Yuan, Z., … Sun, B. (2020). Thermal-induced interface degradation in perovskite light-emitting diodes. Journal of Materials Chemistry C, 8(43), 15079-15085. https://doi.org/10.1039/D0TC03816D