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Transmission electron microscopy characterization of TiN/SiN<SUB>x</SUB> multilayered coatings plastically deformed by nanoindentation
Parlinska-Wojtan, M., Meier, S., & Patscheider, J. (2010). Transmission electron microscopy characterization of TiN/SiNx multilayered coatings plastically deformed by nanoindentation. Thin Solid Films, 518(17), 4890-4897. https://doi.org/10.1016/j.tsf.2010.02.064