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Quantifying the elemental distribution in solar cells from X-Ray fluorescence measurements with multiple detector modules
Ziska, C., Ossig, C., Pyrlik, N., Carron, R., Avancini, E., Fevola, G., … Stuckelberger, M. E. (2020). Quantifying the elemental distribution in solar cells from X-Ray fluorescence measurements with multiple detector modules. In 47th IEEE Photovoltaic Specialists Conference (PVSC 2020) (pp. 1085-1092). https://doi.org/10.1109/PVSC45281.2020.9300345
Study of the morphology of organic ferroelectric diodes with combined scanning force and scanning transmission X-ray microscopy
Bernard, L., Khikhlovskyi, V., van Breemen, A., Michels, J. J., Janssen, R., Kemerink, M., … Pilet, N. (2018). Study of the morphology of organic ferroelectric diodes with combined scanning force and scanning transmission X-ray microscopy. Organic Electronics, 53, 242-248. https://doi.org/10.1016/j.orgel.2017.11.012
Scanning transmission X-ray microscopy with a fast framing pixel detector
Menzel, A., Kewish, C. M., Kraft, P., Henrich, B., Jefimovs, K., Vila-Comamala, J., … Bunk, O. (2010). Scanning transmission X-ray microscopy with a fast framing pixel detector. Ultramicroscopy, 110(9), 1143-1147. https://doi.org/10.1016/j.ultramic.2010.04.007
Coaxial arrangement of a scanning probe and an X-ray microscope as a novel tool for nanoscience
Schmid, I., Raabe, J., Sarafimov, B., Quitmann, C., Vranjkovic, S., Pellmont, Y., & Hug, H. J. (2010). Coaxial arrangement of a scanning probe and an X-ray microscope as a novel tool for nanoscience. Ultramicroscopy, 110(10), 1267-1272. https://doi.org/10.1016/j.ultramic.2010.05.002
Advanced methods in scanning X-ray microscopy
Menzel, A., Dierolf, M., Kewish, C. M., Thibault, P., Jefimovs, K., David, C., … Bunk, O. (2009). Advanced methods in scanning X-ray microscopy. In M. T. Postek, D. E. Newbury, S. F. Platek, & D. C. Joy (Eds.), Proceedings of SPIE: Vol. 7378. Scanning microscopy 2009 (p. 73780O). https://doi.org/10.1117/12.821823
Advanced thin film technology for ultrahigh resolution X-ray microscopy
Vila-Comamala, J., Jefimovs, K., Raabe, J., Pilvi, T., Fink, R. H., Senoner, M., … David, C. (2009). Advanced thin film technology for ultrahigh resolution X-ray microscopy. Ultramicroscopy, 109(11), 1360-1364. https://doi.org/10.1016/j.ultramic.2009.07.005