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	Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals Meduňa, M., Isa, F., Jung, A., Marzegalli, A., Albani, M., Isella, G., … von Känel, H. (2018). Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. Journal of Applied Crystallography, 51(2), 368-385. https://doi.org/10.1107/S1600576718001450 Detailed Record Published Version
	Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling Meduna, M., Falub, C. V., Isa, F., Marzegalli, A., Chrastina, D., Isella, G., … von Känel, H. (2016). Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling. Journal of Applied Crystallography, 49, 976-986. https://doi.org/10.1107/S1600576716006397 Detailed Record Published Version