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Optimizing and applying high‐resolution, in‐line laboratory phase‐contrast X‐ray imaging for low‐density material samples
Zboray, R. (2021). Optimizing and applying high‐resolution, in‐line laboratory phase‐contrast X‐ray imaging for low‐density material samples. Journal of Microscopy, 282(2), 123-135. https://doi.org/10.1111/jmi.12986
Resolution limits of terahertz ptychography
Valzania, L., Hack, E., Zolliker, P., Brönnimann, R., & Feurer, T. (2018). Resolution limits of terahertz ptychography. In C. Fournier, M. P. Georges, & G. Popescu (Eds.), Proceedings of SPIE: Vol. 10677. Unconventional optical imaging (p. 1067720 (8 pp.). https://doi.org/10.1117/12.2307157
Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
Kewish, C. M., Thibault, P., Dierolf, M., Bunk, O., Menzel, A., Vila-Comamala, J., … Pfeiffer, F. (2010). Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics. Ultramicroscopy, 110(4), 325-329. https://doi.org/10.1016/j.ultramic.2010.01.004