Active Filters

  • (-) Keywords = phase retrieval
  • (-) Keywords = X-ray optics
Search Results 1 - 1 of 1
  • RSS Feed
Select Page
Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
Kewish, C. M., Thibault, P., Dierolf, M., Bunk, O., Menzel, A., Vila-Comamala, J., … Pfeiffer, F. (2010). Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics. Ultramicroscopy, 110(4), 325-329. https://doi.org/10.1016/j.ultramic.2010.01.004