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Strain depth profiles in thin films extracted from in-plane X-ray diffraction
Cancellieri, C., Ariosa, D., Druzhinin, A. V., Unutulmazsoy, Y., Neels, A., & Jeurgens, L. P. H. (2021). Strain depth profiles in thin films extracted from in-plane X-ray diffraction. Journal of Applied Crystallography, 54, 87-98. https://doi.org/10.1107/S1600576720014843