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  • (-) Empa Authors ≠ Grossmann, Günter
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Electromechanical behavior of Al/Al<sub>2</sub>O<sub>3</sub> multilayers on flexible substrates: insights from in situ film stress and resistance measurements
Putz, B., Edwards, T. E. J., Huszar, E., Gruber, P. A., Gradwohl, K. P., Kreiml, P., … Michler, J. (2023). Electromechanical behavior of Al/Al2O3 multilayers on flexible substrates: insights from in situ film stress and resistance measurements. Advanced Engineering Materials, 25(2), 2200951 (15 pp.). https://doi.org/10.1002/adem.202200951
<I>In situ</I> electron microscopy mechanical testing of silicon nanowires using electrostatically actuated tensile stages
Zhang, D., Breguet, J. M., Clavel, R., Sivakov, V., Christiansen, S., & Michler, J. (2010). In situ electron microscopy mechanical testing of silicon nanowires using electrostatically actuated tensile stages. Journal of Microelectromechanical Systems, 19(3), 663-674. https://doi.org/10.1109/JMEMS.2010.2044746
A nano-tensile testing system for studying nanostructures inside an electron microscope: design, characterization and application
Zhang, D. (2010). A nano-tensile testing system for studying nanostructures inside an electron microscope: design, characterization and application [Doctoral dissertation, EPF Lausanne]. https://doi.org/10.5075/epfl-thesis-4605