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<I>In situ</I> electron microscopy mechanical testing of silicon nanowires using electrostatically actuated tensile stages
Zhang, D., Breguet, J. M., Clavel, R., Sivakov, V., Christiansen, S., & Michler, J. (2010). In situ electron microscopy mechanical testing of silicon nanowires using electrostatically actuated tensile stages. Journal of Microelectromechanical Systems, 19(3), 663-674. https://doi.org/10.1109/JMEMS.2010.2044746
A nano-tensile testing system for studying nanostructures inside an electron microscope: design, characterization and application
Zhang, D. (2010). A nano-tensile testing system for studying nanostructures inside an electron microscope: design, characterization and application [Doctoral dissertation, EPF Lausanne]. https://doi.org/10.5075/epfl-thesis-4605