Zhang, D., Breguet, J. M., Clavel, R., Sivakov, V., Christiansen, S., & Michler, J. (2010). In situ electron microscopy mechanical testing of silicon nanowires using electrostatically actuated tensile stages. Journal of Microelectromechanical Systems, 19(3), 663-674. https://doi.org/10.1109/JMEMS.2010.2044746