Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals

Li T, Krumeich F, Ihli J, Ma Z, Ishikawa T, Pinar AB & van Bokhoven JA
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Li, T., Krumeich, F., Ihli, J., Ma, Z., Ishikawa, T., Pinar, A. B., & van Bokhoven, J. A. (2019). Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals. Chemical Communications, 55(4), 482-485. https://doi.org/10.1039/c8cc07912a