Inspecting adaptive optics with at-wavelength wavefront metrology

Krempaský J, Koch F, Vagovič P, Mikeš L, Jaggi A, Svetina C, Flechsig U, Patthey L, Marathe S, Batey D, Cipiccia S, Rau C, Seiboth F, Seaberg M, David C & Wagner UH
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Krempaský, J., Koch, F., Vagovič, P., Mikeš, L., Jaggi, A., Svetina, C., … Wagner, U. H. (2018). Inspecting adaptive optics with at-wavelength wavefront metrology. In D. Spiga & H. Mimura (Eds.), Proceedings of SPIE: Vol. 10761. Adaptive X-ray optics V (p. 107610D (8 pp.). https://doi.org/10.1117/12.2320532