Imaging electron-density fluctuations by multidimensional X-ray photon-coincidence diffraction

Ye L, Rouxel JR, Cho D & Mukamel S
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Ye, L., Rouxel, J. R., Cho, D., & Mukamel, S. (2019). Imaging electron-density fluctuations by multidimensional X-ray photon-coincidence diffraction. Proceedings of the National Academy of Sciences of the United States of America PNAS, 116(2), 395-400. https://doi.org/10.1073/pnas.1816730116