Revealing the intrinsic electronic structure of 3D half‐heusler thermoelectric materials by angle‐resolved photoemission spectroscopy

Fu C, Yao M, Chen X, Maulana LZ, Li X, Yang J, Imasato K, Zhu F, Li G, Auffermann G, Burkhardt U, Schnelle W, Zhou J, Zhu T, Zhao X, Shi M, Dressel M, Pronin AV, Snyder GJ & Felser C
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Fu, C., Yao, M., Chen, X., Maulana, L. Z., Li, X., Yang, J., … Felser, C. (2020). Revealing the intrinsic electronic structure of 3D half‐heusler thermoelectric materials by angle‐resolved photoemission spectroscopy. Advanced Science, 7(1), 1902409 (8 pp.). https://doi.org/10.1002/advs.201902409