Synchrotron hard X-ray chemical imaging of trace element speciation in heterogeneous samples: development of criteria for uncertainty analysis

Wielinski J, Femi Marafatto F, Gogos A, Scheidegger A, Voegelin A, Müller CR, Morgenroth E & Kaegi R
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Wielinski, J., Femi Marafatto, F., Gogos, A., Scheidegger, A., Voegelin, A., Müller, C. R., … Kaegi, R. (2020). Synchrotron hard X-ray chemical imaging of trace element speciation in heterogeneous samples: development of criteria for uncertainty analysis. Journal of Analytical Atomic Spectrometry, 35(3), 567-579. https://doi.org/10.1039/C9JA00394K