Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays

Niozu A, Kumagai Y, Nishiyama T, Fukuzawa H, Motomura K, Bucher M, Asa K, Sato Y, Ito Y, Takanashi T, You D, Ono T, Li Y, Kukk E, Miron C, Neagu L, Callegari C, Di Fraia M, Rossi G, Galli DE, Pincelli T, Colombo A, Owada S, Tono K, Kameshima T, Joti Y, Katayama T, Togashi T, Yabashi M, Matsuda K, Nagaya K, Bostedt C & Ueda K
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Niozu, A., Kumagai, Y., Nishiyama, T., Fukuzawa, H., Motomura, K., Bucher, M., … Ueda, K. (2020). Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays. IUCrJ, 7, 276-286. https://doi.org/10.1107/S205225252000144X