基于重离子试验数据预测纳米加固静态随机 存储器质子单粒子效应敏感性. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory

Luo YH, Zhang F-Q, Guo H-X & Hajdas W
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Luo, Y. H., Zhang, F. Q., Guo, H. X., & Hajdas, W. (2020). 基于重离子试验数据预测纳米加固静态随机 存储器质子单粒子效应敏感性. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory. Acta Physica Sinica, 69(1), 018501 (9 pp.). https://doi.org/10.7498/aps.69.20190878