Monitoring the morphological changes of Si-based electrodes by X-ray computed tomography: a 4D-multiscale approach

Vanpeene V, Villanova J, Suuronen J-P, King A, Bonnin A, Adrien J, Maire E & Roué L
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Vanpeene, V., Villanova, J., Suuronen, J. P., King, A., Bonnin, A., Adrien, J., … Roué, L. (2020). Monitoring the morphological changes of Si-based electrodes by X-ray computed tomography: a 4D-multiscale approach. Nano Energy, 74, 104848 (15 pp.). https://doi.org/10.1016/j.nanoen.2020.104848