Modeling of beam hardening effects in a dual-phase X-ray grating interferometer for quantitative dark-field imaging

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Pandeshwar, A., Kagias, M., Wang, Z., & Stampanoni, M. (2020). Modeling of beam hardening effects in a dual-phase X-ray grating interferometer for quantitative dark-field imaging. Optics Express, 28(13), 19187 (18 pp.). https://doi.org/10.1364/OE.395237