Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p-n junctions

Gramse G, Kölker A, Škereň T, Stock TJZ, Aeppli G, Kienberger F, Fuhrer A & Curson NJ
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Gramse, G., Kölker, A., Škereň, T., Stock, T. J. Z., Aeppli, G., Kienberger, F., … Curson, N. J. (2020). Nanoscale imaging of mobile carriers and trapped charges in delta doped silicon p-n junctions. Nature Electronics, 3, 531-538. https://doi.org/10.1038/s41928-020-0450-8