SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Coronetti A, Cecchetto M, Wang J, Tali M, Fernandez Martinez P, Kastriotou M, Papadopoulou A, Bilko K, Castellani F, Sacristan M, García Alía R, Cazzaniga C, Morilla Y, Martìn-Holgado P, Van Goethem M-J, Kiewiet H, van Der Graaf E, Brandenburg S, Hajdas W, Sinkunaite L, Marszalek M, Kettunen H, Rossi M, Jaatinen J, Javanainen A, Moscatello M-H, Dubois A, Fiore S, Bazzano G, Frost C, Letiche M, Farabolini W, Gilardi A, Corsini R & Puchner H
Choose the citation style.
Coronetti, A., Cecchetto, M., Wang, J., Tali, M., Fernandez Martinez, P., Kastriotou, M., … Puchner, H. (2020). SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below. In IEEE workshop on radiation effects data: Vol. 2020-November. 2020 EEE radiation effects data workshop (REDW). Workshop record (p. 9325822 (8 pp.). https://doi.org/10.1109/REDW51883.2020.9325822