Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Wittwer F, Lyubomirskiy M, Koch F, Kahnt M, Seyrich M, Garrevoet J, David C & Schroer CG
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Wittwer, F., Lyubomirskiy, M., Koch, F., Kahnt, M., Seyrich, M., Garrevoet, J., … Schroer, C. G. (2021). Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view. Applied Physics Letters, 118(17), 171102 (5 pp.). https://doi.org/10.1063/5.0045571