Fast defect mapping at the SiO2/SiC interface using confocal photoluminescence
Woerle J, Johnson BC, Stark R, Camarda M & Grossner U
Woerle, J., Johnson, B. C., Stark, R., Camarda, M., & Grossner, U. (2022). Fast defect mapping at the SiO2/SiC interface using confocal photoluminescence. In J. F. Michaud, L. V. Phung, D. Alquier, & D. Planson (Eds.), Materials science forum: Vol. 1062. Silicon carbide and related materials 2021 (pp. 389-394). https://doi.org/10.4028/p-78l92c