Measurement of liquid films thickness in a condensing and re-evaporating environment using attenuation of near infrared light

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Mignot, G., Dupont, J., Paranjape, S., Ouldrebai, H., Bissels, W. M., Paladino, D., & Prasser, H. M. (2018). Measurement of liquid films thickness in a condensing and re-evaporating environment using attenuation of near infrared light. Nuclear Engineering and Design, 336, 64-73. https://doi.org/10.1016/j.nucengdes.2017.06.023