Model-free classification of X-ray scattering signals applied to image segmentation

Lutz-Bueno V, Arboleda C, Leu L, Blunt MJ, Busch A, Georgiadis A, Bertier P, Schmatz J, Varga Z, Villanueva-Perez P, Wang Z, Lebugle M, David C, Stampanoni M, Diaz A, Guizar-Sicairosa M & Menzel A
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Lutz-Bueno, V., Arboleda, C., Leu, L., Blunt, M. J., Busch, A., Georgiadis, A., … Menzel, A. (2018). Model-free classification of X-ray scattering signals applied to image segmentation. Journal of Applied Crystallography, 51(5), 1378-1386. https://doi.org/10.1107/S1600576718011032