Proton direct ionization in sub-micron technologies: test methodologies and modelling
Lüdeke S, Durán Cardenás G, Hajdas W, Jaatinen J, Kettunen H, Poivey C, Rossi M, Tanios B, Vogiatzi SM & Javanainen A
Lüdeke, S., Durán Cardenás, G., Hajdas, W., Jaatinen, J., Kettunen, H., Poivey, C., … Javanainen, A. (2023). Proton direct ionization in sub-micron technologies: test methodologies and modelling. IEEE Transactions on Nuclear Science, 70(4), 667-677. https://doi.org/10.1109/TNS.2023.3255008