Testing high-resolution transverse profile monitors by measuring the dependence of the electron beam size on the beam energy at SwissFEL

Juranić, Pavle; Prat, Eduard

doi:10.1063/5.0155444

Testing high-resolution transverse profile monitors by measuring the dependence of the electron beam size on the beam energy at SwissFEL

Citation

Juranić, P., & Prat, E. (2023). Testing high-resolution transverse profile monitors by measuring the dependence of the electron beam size on the beam energy at SwissFEL. Review of Scientific Instruments, 94(7), 073301 (5 pp.). https://doi.org/10.1063/5.0155444

Persistent URL https://www.dora.lib4ri.ch/psi/islandora/object/psi:53094

Transverse profile monitors are essential devices to characterize particle beams in accelerators. Here, we present an improved design of beam profile monitors at SwissFEL that combines the use of high-quality filters and dynamic focusing. We reconstruct the profile monitor resolution in a gentle way by measuring the electron beam size for different energies. The results show a significant improvement of the new design compared to the previous version, from 20 to 14 µm.

Details

Publication Type

Journal Article

Title

Testing high-resolution transverse profile monitors by measuring the dependence of the electron beam size on the beam energy at SwissFEL

Author(s)

Juranić, Pavle (8123 Electron Beam Instrumentation)

Prat, Eduard (8122 FEL Beam Dynamics)

Journal