Employing X-ray spectromicroscopy for the understanding of anisotropy in organic thin film growth

Hawly T, Späth A, Johnson M, Streller F, Watts B, Raabe J & Fink RH
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Hawly, T., Späth, A., Johnson, M., Streller, F., Watts, B., Raabe, J., & Fink, R. H. (2023). Employing X-ray spectromicroscopy for the understanding of anisotropy in organic thin film growth. In T. H. Chuang, B. H. Lin, H. W. Shiu, & D. H. Wei (Eds.), AIP conference proceedings: Vol. 2990. Proceedings of the 15th international conference on X-ray microscopy - XRM2022 (p. 020009 (4 pp.). https://doi.org/10.1063/5.0168224