Frustration-induced quantum criticality in Ni-doped CePdAl as revealed by the μ SR technique

Ishant I, Shiroka T, Stockert O, Fritsch V & Majumder M
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Ishant, I., Shiroka, T., Stockert, O., Fritsch, V., & Majumder, M. (2024). Frustration-induced quantum criticality in Ni-doped CePdAl as revealed by the μ SR technique. Physical Review Research, 6(2), 023112 (8 pp.). https://doi.org/10.1103/PhysRevResearch.6.023112