A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy

De Angelis D, Longetti L, Bonano G, Cresi JSP, Foglia L, Pancaldi M, Capotondi F, Pedersoli E, Bencivenga F, Krstulovic M, Menk RH, D’Addato S, Orlando S, de Simone M, Ingle RA, Bleiner D, Coreno M, Principi E, Chergui M, Masciovecchio C & Mincigrucci R
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De Angelis, D., Longetti, L., Bonano, G., Cresi, J. S. P., Foglia, L., Pancaldi, M., … Mincigrucci, R. (2024). A sub-100 nm thickness flat jet for extreme ultraviolet to soft X-ray absorption spectroscopy. Journal of Synchrotron Radiation, 31(Part 3), 605-612. https://doi.org/10.1107/S1600577524001875