Real-time beam profile uniformity monitoring system

Britvitch I, Hajdas W, Scherrer S, Egli K, Mozzanica A & Schmitt B
Choose the citation style.
Britvitch, I., Hajdas, W., Scherrer, S., Egli, K., Mozzanica, A., & Schmitt, B. (2013). Real-time beam profile uniformity monitoring system. IEEE Transactions on Nuclear Science, 60(5), 3802-3804. https://doi.org/10.1109/TNS.2013.2280032
https://www.dora.lib4ri.ch/psi/islandora/object/psi:11195

New, multi-pixel, air-filled ionization chamber for beam monitoring was constructed. For processing of 400 input signals, it utilizes a dedicated, homemade ASIC. Device parameters: sensitivity, resolution, dynamic range, etc. are discussed together with results from the particle beam tests.

Details
Publication Type

Journal Article

Title

Real-time beam profile uniformity monitoring system

Author(s)

Britvitch, I. (3206 Detectors, Irradiation, Applied Particle Physics)

Hajdas, W. (3206 Detectors, Irradiation, Applied Particle Physics)

Scherrer, S. (3205 Electronics for Measuring Systems)

Egli, K. (3206 Detectors, Irradiation, Applied Particle Physics)

Mozzanica, A. (1620 Photonics)

Schmitt, B. (6114 Detectors)

Journal

IEEE Transactions on Nuclear Science

Volume

60

Issue

5

Start Page

3802

End Page

3804

Publication Year

2013

Peer Review

Yes

Keywords

high energy physics instrumentation
instrumentation and measurement
particle beam measurements
radiation monitoring

Facility

CHRISP

Beamline

PIF

Collection

PSI Publications