Synchrotron-based X-ray Tomographic Microscopy at the Swiss Light Source for Industrial Applications

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Marone, F., Mokso, R., Fife, J. L., Irvine, S., Modregger, P., Pinzer, B. R., … Stampanoni, M. (2011). Synchrotron-based X-ray Tomographic Microscopy at the Swiss Light Source for Industrial Applications. Synchrotron Radiation News, 24(6), 24-29. https://doi.org/10.1080/08940886.2011.634315