Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam-defining optics

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Odstrcil, M., Lebugle, M., Lachat, T., Raabe, J., & Holler, M. (2019). Fast positioning for X-ray scanning microscopy by a combined motion of sample and beam-defining optics. Journal of Synchrotron Radiation, 26(2), 504-509. https://doi.org/10.1107/S160057751801785X