Sensitivity in X-ray grating interferometry on compact systems

Thuering T, Modregger P, Hämmerle S, Weiss S, Nüesch J & Stampanoni M
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Thuering, T., Modregger, P., Hämmerle, S., Weiss, S., Nüesch, J., & Stampanoni, M. (2012). Sensitivity in X-ray grating interferometry on compact systems. In AIP conference proceedings: Vol. 1466. International workshop on x-ray and neutron phase imaging with gratings. https://doi.org/10.1063/1.4742307