A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Szlachetko, J.; Nachtegaal, M.; de Boni, E.; Willimann, M.; Safonova, O.; Sa, J.; Smolentsev, G.; Szlachetko, M.; van Bokhoven, J.A.; Dousse, J.-Cl.; Hoszowska, J.; Kayser, Y.; Jagodzinski, P.; Bergamaschi, A.; Schmitt, B.; David, C.; Lücke, A.

doi:10.1063/1.4756691

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Szlachetko J, Nachtegaal M, de Boni E, Willimann M, Safonova O, Sa J, Smolentsev G, Szlachetko M, van Bokhoven JA, Dousse J-C, Hoszowska J, Kayser Y, Jagodzinski P, Bergamaschi A, Schmitt B, David C & Lücke A

Citation

Szlachetko, J., Nachtegaal, M., de Boni, E., Willimann, M., Safonova, O., Sa, J., … Lücke, A. (2012). A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies. Review of Scientific Instruments, 83(10), 103105 (7 pp.). https://doi.org/10.1063/1.4756691

Persistent URL https://www.dora.lib4ri.ch/psi/islandora/object/psi:23642

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

Details

Publication Type

Journal Article

Title

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Author(s)

Szlachetko, J. (5104 In situ X-ray Spectroscopy)

Nachtegaal, M. (5104 In situ X-ray Spectroscopy)

de Boni, E. (5101 Catalytic Process Engineering)

Willimann, M. (6412 microXAS)

Safonova, O. (5104 In situ X-ray Spectroscopy)

Sa, J. (6400 Catalysis and Sustainable Chemistry)

Smolentsev, G. (5104 In situ X-ray Spectroscopy)

Szlachetko, M. (6400 Catalysis and Sustainable Chemistry)

van Bokhoven, J.A. (6400 Catalysis and Sustainable Chemistry)

Dousse, J.-Cl.

Hoszowska, J.