X-ray spectroscopy with variable line spacing based on reflection zone plate optics

Yin Z, Löchel H, Rehanek J, Goy C, Kalinin A, Schottelius A, Trinter F, Miedema P, Jain A, Valerio J, Busse P, Lehmkühler F, Möller J, Grübel G, Madsen A, Viefhaus J, Grisenti RE, Beye M, Erko A & Techert S
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Yin, Z., Löchel, H., Rehanek, J., Goy, C., Kalinin, A., Schottelius, A., … Techert, S. (2018). X-ray spectroscopy with variable line spacing based on reflection zone plate optics. Optics Letters, 43(18), 4390-4393. https://doi.org/10.1364/OL.43.004390