X-ray spectroscopy with variable line spacing based on reflection zone plate optics
Yin Z, Löchel H, Rehanek J, Goy C, Kalinin A, Schottelius A, Trinter F, Miedema P, Jain A, Valerio J, Busse P, Lehmkühler F, Möller J, Grübel G, Madsen A, Viefhaus J, Grisenti RE, Beye M, Erko A & Techert S
Yin, Z., Löchel, H., Rehanek, J., Goy, C., Kalinin, A., Schottelius, A., … Techert, S. (2018). X-ray spectroscopy with variable line spacing based on reflection zone plate optics. Optics Letters, 43(18), 4390-4393. https://doi.org/10.1364/OL.43.004390