Influence of variation of etching conditions on the sensitivity of PADC detectors with a new evaluation method
Fiechtner-Scharrer, A., Mayer, S., Boschung, M., & Whitelaw, A. (2011). Influence of variation of etching conditions on the sensitivity of PADC detectors with a new evaluation method. Radiation Protection Dosimetry, 144(1-4), 150-154. https://doi.org/10.1093/rpd/ncq558