Low-energy muons as a tool for a depth-resolved analysis of the SiO2/4H-SiC interface

Woerle J, Prokscha T & Grossner U
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Woerle, J., Prokscha, T., & Grossner, U. (2020). Low-energy muons as a tool for a depth-resolved analysis of the SiO2/4H-SiC interface. H. Yano, T. Ohshima, K. Eto, S. Harada, T. Mitani, & Y. Tanaka (Eds.), Materials science forum: Vol. 1004. (pp. 581-586). Presented at the 18th international conference on silicon carbide and related materials 2019 (ICSCRM 2019). https://doi.org/10.4028/www.scientific.net/MSF.1004.581