This paper presents the results of using the laboratory X-ray system to study the diamond X-ray optics: single-crystal diamond plates and diamond X-ray parabolic refractive lenses. The system is equipped with the Excillum MetalJet D2+ 70kV high-brightness X-ray source with a liquid GaIn anode. To analyze the defects of the crystal structure, the X-ray diffraction imaging (topography) technique was applied. Two-dimensional images of the diamond plate were experimentally recorded from (111) crystal plane with 12 μm and 1.5 μm resolution. The images of the X-ray semi-lens were recorded from (400) and (220) crystal planes with 20 μm resolution. These topographs displayed various defects, such as growth striations and dislocations.