Multi-wavelength ultrafast ptychography: a flexible beamline with a compact high harmonic source

Bevis CS, Grova C, Adams DA, Svetina CS & Mancini GF
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Bevis, C. S., Grova, C., Adams, D. A., Svetina, C. S., & Mancini, G. F. (2022). Multi-wavelength ultrafast ptychography: a flexible beamline with a compact high harmonic source. In International conference on ultrafast phenomena. Proceedings the international conference on ultrafast phenomena (UP) 2022 (p. Th4A.41 (2 pp.). https://doi.org/10.1364/UP.2022.Th4A.41
https://www.dora.lib4ri.ch/psi/islandora/object/psi:46314

We report the design of a flexible beamline for ultrafast multiwavelength ptychography to image nano-to-mesoscale heterogeneity in nanostructures and interfaces, with quantitative amplitude and phase contrast, sub-50nm spatial and sub-50fs temporal resolutions.

Details
Publication Type

Proceedings Paper

Title

Multi-wavelength ultrafast ptychography: a flexible beamline with a compact high harmonic source

Author(s)

Bevis, Charles S.

Grova, Carmelo

Adams, Daniel A.

Svetina, Cristian S. (6515 Ultrafast Spectroscopy of Condensed Matter)

Mancini, Giulia F.

Conference Proceedings

Proceedings the international conference on ultrafast phenomena (UP) 2022

Editor(s)

(editor)

Series Title

International conference on ultrafast phenomena

Publisher

Optica Publishing Group

Publication Place

Washington, DC

Start Page

Th4A.41 (2 pp.)

Publication Year

2022

Conference

International conference on ultrafast phenomena 2022

Conference Place

Montreal

Conference Date

July 18-22, 2022

Funding (EC, SNSF)

European Commission: ULTRAIMAGE - Advanced EUV/soft X-ray microscopy in the ultrafast regime: imaging functionality of nanomaterials across length scales (851154)

Collection

PSI Publications
Open Access

Additional Information

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