Characterisation of irradiated thin silicon sensors for the CMS phase II pixel upgrade

Adam W, Bergauer T, Brondolin E, Dragicevic M, Friedl M, Frühwirth R, Hoch M, Hrubec J, König A, Steininger H, Bertl W, Deiters K, Erdmann W, Horisberger R, Kaestli H-C, Kotlinski D, Langenegger U, Meier B, Rohe T, Streuli S, Johns W, et al.
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Adam, W., Bergauer, T., Brondolin, E., Dragicevic, M., Friedl, M., Frühwirth, R., … Johns, W. (2017). Characterisation of irradiated thin silicon sensors for the CMS phase II pixel upgrade. European Physical Journal C: Particles and Fields, 77(8), 567 (13 pp.). https://doi.org/10.1140/epjc/s10052-017-5115-z