Characterisation of irradiated thin silicon sensors for the CMS phase II pixel upgrade
Adam W, Bergauer T, Brondolin E, Dragicevic M, Friedl M, Frühwirth R, Hoch M, Hrubec J, König A, Steininger H, Bertl W, Deiters K, Erdmann W, Horisberger R, Kaestli H-C, Kotlinski D, Langenegger U, Meier B, Rohe T, Streuli S, Johns W, et al.
Adam, W., Bergauer, T., Brondolin, E., Dragicevic, M., Friedl, M., Frühwirth, R., … Johns, W. (2017). Characterisation of irradiated thin silicon sensors for the CMS phase II pixel upgrade. European Physical Journal C: Particles and Fields, 77(8), 567 (13 pp.). https://doi.org/10.1140/epjc/s10052-017-5115-z