Characterization of helical APPLE X undulators with 90 mm period for the European XFEL

Yakopov, M.; Calvi, M.; Casalbuoni, S.; Englisch, U.; Karabekyan, S.; Liang, X.; Schmidt, T.

doi:10.1088/1742-6596/2380/1/012019

Characterization of helical APPLE X undulators with 90 mm period for the European XFEL

Yakopov M, Calvi M, Casalbuoni S, Englisch U, Karabekyan S, Liang X & Schmidt T

Citation

Yakopov, M., Calvi, M., Casalbuoni, S., Englisch, U., Karabekyan, S., Liang, X., & Schmidt, T. (2022). Characterization of helical APPLE X undulators with 90 mm period for the European XFEL. In W. Laasch & T. Tschentscher (Eds.), Journal of physics: conference series: Vol. 2380. 14th international conference on synchrotron radiation instrumentation (SRI 2021) (p. 012019 (6 pp.). https://doi.org/10.1088/1742-6596/2380/1/012019

Persistent URL https://www.dora.lib4ri.ch/psi/islandora/object/psi:50768

European XFEL is going to provide full polarization control in the soft X-ray SASE line (SASE3). For this purpose, four helical APPLE X undulators with 90 mm period are installed downstream with respect to the planar undulators of the SASE3 undulator line consisting of 21 planar undulators with 68 mm period. In this contribution, the measurement technique, as well as the results of the measurements and tuning of the APPLE X undulators performed at European XFEL are presented.

Details

Publication Type

Proceedings Paper

Title

Characterization of helical APPLE X undulators with 90 mm period for the European XFEL

Author(s)

Yakopov, M.

Calvi, M. (6511 Insertion Devices)

Casalbuoni, S.

Englisch, U.

Karabekyan, S.

Liang, X. (6511 Insertion Devices)